Invention Grant
- Patent Title: Three-dimensional NAND flash memory device having improved data reliability by varying program intervals, and method of operating the same
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Application No.: US16935598Application Date: 2020-07-22
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Publication No.: US11205485B2Publication Date: 2021-12-21
- Inventor: Seung-Bum Kim , Min-Su Kim , Deok-Woo Lee
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: Volentine, Whitt & Francos, PLLC
- Priority: KR10-2018-0037763 20180330
- Main IPC: G11C16/10
- IPC: G11C16/10 ; G11C16/04 ; G11C16/08 ; G11C16/34 ; H01L25/065 ; H01L25/18 ; H01L23/00 ; H01L27/11556 ; H01L27/11582

Abstract:
A memory device includes: a memory cell region; a peripheral circuit region; a memory cell array; a control logic circuit; and a row decoder. The row decoder is configured to activate string selection lines based on control of the control logic circuit. A program interval is formed between a first program operation and a second program operation. The control logic circuit includes a reprogram controller configured to control the row decoder so that a program interval differs in the memory cells connected to different string selection lines among the memory cells connected to a first wordline.
Public/Granted literature
- US20200350020A1 MEMORY DEVICE HAVING IMPROVED DATA RELIABILITY AND METHOD OF OPERATING THE SAME Public/Granted day:2020-11-05
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