Invention Grant
- Patent Title: Scan abutment having an enlarged scan surface
-
Application No.: US15771473Application Date: 2016-10-26
-
Publication No.: US11213371B2Publication Date: 2022-01-04
- Inventor: Matthias Funk
- Applicant: KULZER GMBH
- Applicant Address: DE Hanau
- Assignee: KULZER GMBH
- Current Assignee: KULZER GMBH
- Current Assignee Address: DE Hanau
- Agency: Norris McLaughlin, P.A.
- Priority: DE102015118285.8 20151027
- International Application: PCT/EP2016/075795 WO 20161026
- International Announcement: WO2017/072171 WO 20170504
- Main IPC: A61C8/00
- IPC: A61C8/00 ; A61C9/00 ; A61K6/84 ; A61K6/90 ; A61K6/844 ; A61K6/887 ; A61K6/891 ; A61C13/00

Abstract:
The invention relates to a scan abutment (2) for determination of the position of the plane of the front face (1.1) of a dental endosseous implant (1), wherein the abutment (2) has a longish, hollow shaft (4) and a base (3) at the bottom side (4.2) of the shaft (4), and the base (3) with at least a part of its bottom side (8.2) is attachable onto the front face (1.1) of the implant (1), wherein the base (3) has a recess (9) extending from the upper side (8.1) to the lower side (8.2) of the base (3), wherein the longish, hollow shaft (4) has from a side wall (10) having at least one through hole (5a) at its outer periphery, wherein the through hole of the side wall (10) extends from the bottom side (4.2) of the shaft (4) to the upper side (4.1) of the shaft, thereby forming a planar surface (6) in the plane (12) between shaft (4) and base (3).
Public/Granted literature
- US20180303584A1 SCAN ABUTMENT HAVING AN ENLARGED SCAN SURFACE Public/Granted day:2018-10-25
Information query