An illustrative parametric testing system includes a motherboard disposable over a wafer prober chuck. First electrical connectors are disposed on and electrically connected to the motherboard. At least one parametric testing cards is disposable in physical and electrical contact with an associated one of the first electrical connectors proximal a pad of a device under test. The parametric testing card includes electronic circuitry configured to receive a digital signal indicative of test plan instructions, generate an analog stimulus signal for a device under test responsive to the test plan instructions, perform an analog measurement of a stimulated device under test, and transmit a digital signal indicative of the measurement of a device under test. The system includes an interface to a computing system. The interface is electrically connectable to the motherboard. The system includes at least one power supply electrically connectable to the motherboard.