Invention Grant
- Patent Title: Vision inspection management method and system inspecting based on process data
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Application No.: US16257667Application Date: 2019-01-25
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Publication No.: US11216935B2Publication Date: 2022-01-04
- Inventor: Chihyun Cho , Changbae Yoon , Jinguk Jeong
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agency: Jefferson IP Law, LLP
- Priority: KR10-2018-0012343 20180131
- Main IPC: G06T7/00
- IPC: G06T7/00 ; G06N3/08 ; G06N20/00

Abstract:
A method, performed by a process management apparatus, of managing vision inspection using an artificial intelligence (AI) model and an apparatus therefor are provided. The method includes obtaining first process data related to a first manufacturing process through which a first object passes, identifying a first region on which intensive inspection is to be performed in an entire region of the first object using the AI model and the first process data, controlling a first vision inspector to inspect the identified first region, and determining whether a defect is present in the identified first region.
Public/Granted literature
- US20190236772A1 VISION INSPECTION MANAGEMENT METHOD AND VISION INSPECTION SYSTEM Public/Granted day:2019-08-01
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