Invention Grant
- Patent Title: Selectively squelching differential strobe input signal in memory-device testing system
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Application No.: US17021672Application Date: 2020-09-15
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Publication No.: US11217287B2Publication Date: 2022-01-04
- Inventor: Joel Scott Swanson
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Schwegman Lundberg & Woessner, P.A.
- Main IPC: G11C7/22
- IPC: G11C7/22 ; H03G3/34 ; G11C29/12 ; G11C7/10

Abstract:
In an embodiment, a differential strobe input squelch circuit includes a squelch sub-circuit that is configured to perform operations including receiving a true strobe signal, a complement strobe signal, and a strobe difference signal that is representative of a difference between the true strobe signal and the complement strobe signal; determining, based on the true strobe signal and the complement strobe signal, whether the strobe difference signal is defined or undefined; and outputting a modified strobe difference signal that is equal to the strobe difference signal when the squelch sub-circuit determines that the strobe difference signal is defined and that is instead equal to a constant strobe-level voltage when the squelch sub-circuit determines that the strobe difference signal is undefined.
Public/Granted literature
- US20210065756A1 SELECTIVELY SQUELCHING DIFFERENTIAL STROBE INPUT SIGNAL IN MEMORY-DEVICE TESTING SYSTEM Public/Granted day:2021-03-04
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