Invention Grant
- Patent Title: Method of testing and analyzing display panel
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Application No.: US16839828Application Date: 2020-04-03
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Publication No.: US11217649B2Publication Date: 2022-01-04
- Inventor: Choon Leong Lou
- Applicant: STAR TECHNOLOGIES, INC.
- Applicant Address: TW Hsinchu
- Assignee: STAR TECHNOLOGIES, INC.
- Current Assignee: STAR TECHNOLOGIES, INC.
- Current Assignee Address: TW Hsinchu
- Agency: Muncy, Geissler, Olds & Lowe, P.C.
- Main IPC: H01L27/32
- IPC: H01L27/32 ; G02F1/1368 ; H01L51/56 ; H01L21/66 ; G02F1/136

Abstract:
A method for testing and analyzing a display panel, comprising: providing a display panel including a circuitry and a pixel connected to the circuitry, wherein the pixel includes a capacitor, a transistor and an electrode electrically connected to the capacitor and the transistor; measuring a first parameter of the display panel; disabling the pixel; measuring a second parameter of the display panel; and deriving a third parameter of the pixel by subtracting the second parameter from the first parameter.
Public/Granted literature
- US20210313408A1 METHOD OF ANALYZING AND MANUFACTURING DISPLAY PANEL Public/Granted day:2021-10-07
Information query
IPC分类: