Invention Grant
- Patent Title: Silicon photovoltaic cell scanning eddy current thermography detection platform and defect classification method
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Application No.: US16593957Application Date: 2019-10-04
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Publication No.: US11218112B2Publication Date: 2022-01-04
- Inventor: Yigang He , Bolun Du , Yaru Zhang , Jiajun Duan , Liulu He
- Applicant: WUHAN UNIVERSITY
- Applicant Address: CN Hubei
- Assignee: WUHAN UNIVERSITY
- Current Assignee: WUHAN UNIVERSITY
- Current Assignee Address: CN Hubei
- Agency: JCIPRNET
- Priority: CN201910233644.8 20190326
- Main IPC: H02S50/15
- IPC: H02S50/15 ; G06N3/02 ; H01L21/66

Abstract:
The disclosure provides a silicon photovoltaic cell scanning eddy current thermography detection platform and a defect classification method. The technical solution adopted by the disclosure is: firstly, fixing the position of the electromagnetic inductive coil and the thermal imager, and using the main conveyor belt to carry the silicon photovoltaic cell to move forward on the production line to form a scanning eddy current heating of the silicon photovoltaic cell. Secondly, the defect temperature information is obtained through the thermal imager in terms of thermal image sequences. Thirdly, the feature extraction algorithms are used to extract the silicon photovoltaic cell defect features. Finally, the image classification algorithms are used to classify the silicon photovoltaic cell defects, and the sorting conveyor belts are used to realize the automatic sorting of silicon photovoltaic cells with different types of defects on the production line.
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