Invention Grant
- Patent Title: Test system and method for testing a device under test
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Application No.: US16809264Application Date: 2020-03-04
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Publication No.: US11218231B2Publication Date: 2022-01-04
- Inventor: Baris Guezelarslan , Dominik Hettich , Magdalena Poellmann , Kurt Loupal , Adrian Cardalda-Garcia , Matthias Ruttmann , Bledar Karajani
- Applicant: Rohde & Schwarz GmbH & Co. KG
- Applicant Address: DE Munich
- Assignee: Rohde & Schwarz GmbH & Co. KG
- Current Assignee: Rohde & Schwarz GmbH & Co. KG
- Current Assignee Address: DE Munich
- Agency: Christensen O'Connor Johnson Kindness PLLC
- Main IPC: H04B17/20
- IPC: H04B17/20

Abstract:
A test system comprises a device under test and a testing device. The device under test comprises a first initiation unit, wherein the first initiation unit is configured to generate a first wireless initiation signal. The initiation signal consists of at least one of electromagnetic waves and sound waves, wherein the initiation signal comprises a first test command. The testing device comprises a first sensor unit, wherein the first sensor unit is configured to receive the initiation signal via the first sensor unit. The testing device is configured to generate a first electromagnetic test signal based on the first test command.
Public/Granted literature
- US20210175984A1 TEST SYSTEM AND METHOD FOR TESTING A DEVICE UNDER TEST Public/Granted day:2021-06-10
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