- Patent Title: Appearance inspection system, setting device, and inspection method
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Application No.: US16278152Application Date: 2019-02-17
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Publication No.: US11218642B2Publication Date: 2022-01-04
- Inventor: Yutaka Kato
- Applicant: OMRON Corporation
- Applicant Address: JP Kyoto
- Assignee: OMRON Corporation
- Current Assignee: OMRON Corporation
- Current Assignee Address: JP Kyoto
- Agency: JCIPRNET
- Priority: JPJP2018-054593 20180322
- Main IPC: G05B19/416
- IPC: G05B19/416 ; H04N5/232 ; B25J9/16 ; G05B19/401 ; G01N21/95 ; B25J11/00 ; G01N21/88

Abstract:
The disclosure provides an appearance inspection system that can reduce subject blurring when an object is imaged while changing a relative position of an imaging device with respect to the object. A first control unit causes the imaging device to perform imaging when the imaging device reaches an imaging position corresponding to the inspection target position. A second control unit changes at least one of the position and the orientation of the imaging device in a direction in which a relative movement between a field of view of the imaging device and the inspection target position according to the change in the relative position along a designated path is canceled out during a predetermined period including a time point at which the imaging device reaches the imaging position.
Public/Granted literature
- US20190297266A1 APPEARANCE INSPECTION SYSTEM, SETTING DEVICE, AND INSPECTION METHOD Public/Granted day:2019-09-26
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