- Patent Title: Stress relief opening for reducing warpage of component carriers
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Application No.: US16583399Application Date: 2019-09-26
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Publication No.: US11219120B2Publication Date: 2022-01-04
- Inventor: Mikael Tuominen , Artan Baftiri , Nick Xin
- Applicant: AT&S (China) Co. Ltd.
- Applicant Address: CN Shanghai
- Assignee: AT&S (China) Co. Ltd.
- Current Assignee: AT&S (China) Co. Ltd.
- Current Assignee Address: CN Shanghai
- Agency: Smith Tempel Blaha LLC
- Agent Robert A. Blaha
- Priority: CN201811126687.8 20180926
- Main IPC: H05K1/02
- IPC: H05K1/02 ; H05K1/18 ; H05K3/46 ; H05K3/40 ; H05K1/11

Abstract:
A component carrier includes a stack comprising at least one electrically insulating layer structure and/or at least one electrically conductive layer structure, a component embedded in the stack, and at least one stress relief opening formed in each of the at least one electrically conductive layer structure arranged in the stack on one side of the component so that a portion of the stack extending from an exterior main surface of the component carrier up to a main surface of the component on said side and including the at least one stress relief opening is free of electrically conductive material.
Public/Granted literature
- US20200100358A1 Stress Relief Opening for Reducing Warpage of Component Carriers Public/Granted day:2020-03-26
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