A production system includes: a substrate counter configured to count the number of substrates existing in a production line including a mounting device; a mark pattern acquisition unit configured to acquire a mark pattern indicating a pattern of a mark that is provided to each of the plurality of substrates counted by the substrate counter; a determination unit configured to determine whether the respective mark patterns of the plurality of substrates acquired by the mark pattern acquisition unit are the same as each other; and a detection controller configured to control a detection process of the mark pattern by the mounting device based upon a determination result of the determination unit.