Invention Grant
- Patent Title: Error check and scrub for semiconductor memory device
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Application No.: US16816024Application Date: 2020-03-11
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Publication No.: US11221913B2Publication Date: 2022-01-11
- Inventor: Randall J. Rooney , Matthew A. Prather
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Perkins Coie LLP
- Main IPC: G06F11/10
- IPC: G06F11/10 ; G11C11/408 ; G11C11/406

Abstract:
Methods, systems, and apparatuses for a memory device (e.g., DRAM) including an error check and scrub (ECS) procedure in conjunction with refresh operations are described. The ECS procedure may include read/modify-write cycles when errors are detected in code words. In some embodiments, the memory device may complete the ECS procedure over multiple refresh commands, namely by performing a read (or read/modify) portion of the ECS procedure while a first refresh command is executed, and by performing a write portion of the ECS procedure while a second refresh command is executed. The ECS procedure described herein may facilitate avoiding signaling conflicts or interferences that may occur between the ECS procedure and other memory operations.
Public/Granted literature
- US20210286670A1 ERROR CHECK AND SCRUB FOR SEMICONDUCTOR MEMORY DEVICE Public/Granted day:2021-09-16
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