Invention Grant
- Patent Title: Method for depositing a metal layer on a wafer
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Application No.: US16543628Application Date: 2019-08-19
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Publication No.: US11222785B2Publication Date: 2022-01-11
- Inventor: Xijun Guo , Jianhua Chen , Haipeng Zhu , Xianlei Zhang , Min-Hsien Chen , Ching-Ning Yang , Wen Yi Tan
- Applicant: United Semiconductor (Xiamen) Co., Ltd.
- Applicant Address: CN Fujian
- Assignee: United Semiconductor (Xiamen) Co., Ltd.
- Current Assignee: United Semiconductor (Xiamen) Co., Ltd.
- Current Assignee Address: CN Fujian
- Agent Winston Hsu
- Priority: CN201910623790.1 20190711
- Main IPC: C23C14/35
- IPC: C23C14/35 ; H01L21/285 ; C23C14/14

Abstract:
A method for depositing a metal layer on a wafer is disclosed. A PVD chamber is provide having therein a wafer chuck for holding a wafer to be processed, a target situated above the wafer chuck, a magnet positioned on a backside of the target, and a DC power supply for supplying a DC voltage to the target. The target is a metal or a metal alloy having ferromagnetism property. A paste process is performed to the PVD chamber. The paste process includes sequential steps of: admitting a working gas into the PVD chamber; and igniting the working gas in cascade stages. The wafer is then loaded into the PVD chamber and positioned onto the wafer chuck. A deposition process is then performed to deposit a metal layer sputtered from the target onto the wafer.
Public/Granted literature
- US20210013041A1 METHOD FOR DEPOSITING A METAL LAYER ON A WAFER Public/Granted day:2021-01-14
Information query
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