Invention Grant
- Patent Title: Method and apparatus for improving scatter estimation and correction in imaging
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Application No.: US16694218Application Date: 2019-11-25
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Publication No.: US11224396B2Publication Date: 2022-01-18
- Inventor: Daniel Gagnon , Chuanyong Bai , Zhicong Yu , Amit Jain , Calvin R. Maurer, Jr.
- Applicant: Accuray, Inc.
- Applicant Address: US CA Sunnyvale
- Assignee: Accuray, Inc.
- Current Assignee: Accuray, Inc.
- Current Assignee Address: US CA Sunnyvale
- Agency: Calfee, Halter & Griswold LLP
- Main IPC: A61B6/00
- IPC: A61B6/00 ; G06T11/00 ; A61B6/03 ; A61B6/06 ; A61B6/02 ; A61N5/10 ; A61B6/08 ; G06T7/30 ; A61B5/055 ; A61B6/04

Abstract:
An x-ray imaging apparatus and associated methods are provided to receive measured projection data from a wide aperture scan of a wide axial region and a narrow aperture scan of a narrow axial region within the wide axial region and determine an estimated scatter in the wide axial region using an optimized scatter estimation technique. The optimized scatter estimation technique is based on the difference between the measured scatter in the narrow axial region and the estimated scatter in the narrow axial region. Kernel-based scatter estimation/correction techniques can be fitted to minimize the scatter difference in the narrow axial region and thereafter applying the fitted (optimized) kernel-based scatter estimation/correction to the wide axial region. Optimizations can occur in the projection data domain or the reconstruction domain. Iterative processes are also utilized.
Public/Granted literature
- US20200170601A1 METHOD AND APPARATUS FOR IMPROVING SCATTER ESTIMATION AND CORRECTION IN IMAGING Public/Granted day:2020-06-04
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