Invention Grant
- Patent Title: Thin film transistor structure, manufacturing method thereof, and display device
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Application No.: US17043497Application Date: 2018-12-11
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Publication No.: US11227938B2Publication Date: 2022-01-18
- Inventor: Qionghua Mo , En-Tsung Cho
- Applicant: HKC Corporation Limited
- Applicant Address: CN Guangdong
- Assignee: HKC Corporation Limited
- Current Assignee: HKC Corporation Limited
- Current Assignee Address: CN Guangdong
- Agency: Seyfarth Shaw LLP
- Priority: CN201811466314.5 20181203
- International Application: PCT/CN2018/120171 WO 20181211
- International Announcement: WO2020/113613 WO 20200611
- Main IPC: H01L29/66
- IPC: H01L29/66 ; H01L21/02 ; H01L21/28 ; H01L21/3065 ; H01L21/3213 ; H01L27/12 ; H01L29/423 ; H01L29/49 ; H01L29/786

Abstract:
Provided are a thin film transistor structure, a manufacturing method thereof, and a display device. The method comprises: providing a substrate (10), and sequentially forming a gate (20), a gate insulating layer (30), an active layer (40), a doped layer (50), a source (610), a drain (620) and a channel region (70) on the substrate (10); placing the channel region (70) in a preset gas atmosphere for heating treatment; wherein, the channel region (70) is placed in a nitrogen atmosphere to heat for a first preset time, in a mixed atmosphere of nitrogen and ammonia to heat for a second preset time, in an ammonia atmosphere to heat for a third preset time; or first heating the channel region (70) for a fourth preset time, finally placing in the ammonia atmosphere to heat for a fifth preset time.
Public/Granted literature
- US20210057549A1 THIN FILM TRANSISTOR STRUCTURE, MANUFACTURING METHOD THEREOF, AND DISPLAY DEVICE Public/Granted day:2021-02-25
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