Invention Grant
- Patent Title: Layout-friendly test pattern decompressor
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Application No.: US17082462Application Date: 2020-10-28
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Publication No.: US11232246B2Publication Date: 2022-01-25
- Inventor: Yu Huang , Janusz Rajski , Mark A. Kassab , Nilanjan Mukherjee , Jeffrey Mayer
- Applicant: Siemens Industry Software Inc.
- Applicant Address: US TX Plano
- Assignee: Siemens Industry Software Inc.
- Current Assignee: Siemens Industry Software Inc.
- Current Assignee Address: US TX Plano
- Main IPC: G06F30/33
- IPC: G06F30/33 ; G06F30/333 ; G06F30/398 ; H01L25/00 ; H03K19/091 ; H03K19/173 ; G06F111/10 ; G06F119/02

Abstract:
A circuit comprises: a register configured to be a linear finite state machine and comprising storage elements, injection devices, one or more input channels for injecting variables using the injection devices, and one or more feedback devices; a plurality of phase shifters, each of the plurality of phase shifters configured to receive signals from a unique segment of the register; scan chains, serial inputs of the scan chains configured to receive signals from outputs of the plurality of phase shifters, wherein the one or more input channels are coupled to the injection devices at injection points in the register, each of the injection points being assigned to one of the one or more input channels based on lifespan values for the injection points, the injection points being determined based on one or more predetermined requirements.
Public/Granted literature
- US20210150112A1 Layout-Friendly Test Pattern Decompressor Public/Granted day:2021-05-20
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