Invention Grant
- Patent Title: Surveying instrument and program
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Application No.: US15520185Application Date: 2014-10-24
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Publication No.: US11236997B2Publication Date: 2022-02-01
- Inventor: Tomohiro Tanaka , Kazuhito Yamada , Koki Sugihara , Naoko Niimi
- Applicant: NIKON-TRIMBLE CO., LTD
- Applicant Address: JP Tokyo
- Assignee: NIKON-TRIMBLE CO., LTD
- Current Assignee: NIKON-TRIMBLE CO., LTD
- Current Assignee Address: JP Tokyo
- Agency: Oliff PLC
- International Application: PCT/JP2014/078390 WO 20141024
- International Announcement: WO2016/063419 WO 20160428
- Main IPC: G01C1/02
- IPC: G01C1/02 ; G01C1/04 ; G01C15/00 ; G01S5/16 ; G06K9/32 ; G06T3/00 ; G06T3/40

Abstract:
A surveying instrument includes: a survey system; an image sensing system, including first and second image sensing units, the second having an angle of view wider than that of the first; horizontal and vertical angle drivers to rotate the survey and image sensing systems around a surveying instrument vertical and horizontal axes, respectively; a data storage part; an angle detecting part; and a control unit to cause an image, based on image data the first or second generates after imaging, a design data object for showing the design data portion locations included in the image, and coordinate measurement point objects for showing the coordinate measurement points locations, to be surveyed, corresponding to the design data portion included in the image, to appear on a representation device in response to the design data stored in the data storage part and the detected angle.
Public/Granted literature
- US20170307370A1 SURVEYING INSTRUMENT AND PROGRAM Public/Granted day:2017-10-26
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