Invention Grant
- Patent Title: Particle detection systems and methods for on-axis particle detection and/or differential detection
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Application No.: US16857678Application Date: 2020-04-24
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Publication No.: US11237095B2Publication Date: 2022-02-01
- Inventor: Daniel Rodier , James Lumpkin , Dwight Sehler , Brian Knollenberg
- Applicant: PARTICLE MEASURING SYSTEMS, INC.
- Applicant Address: US CO Boulder
- Assignee: PARTICLE MEASURING SYSTEMS, INC.
- Current Assignee: PARTICLE MEASURING SYSTEMS, INC.
- Current Assignee Address: US CO Boulder
- Agency: Leydig, Voit & Mayer, Ltd.
- Main IPC: G01N15/14
- IPC: G01N15/14 ; G01N15/00

Abstract:
Provided herein are optical systems and methods for detecting and characterizing particles. Systems and method are provided which increase the sensitivity of an optical particle counter and allow for detection of smaller particles while analyzing a larger fluid volume. The described systems and methods allow for sensitive and accurate detection and size characterization of nanoscale particles (e.g., less than 50 nm, optionally less than 20 nm, optionally less than 10 nm) for large volumes of analyzed fluids.
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