Invention Grant
- Patent Title: Non-standard sector size system support for SSD testing
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Application No.: US16351371Application Date: 2019-03-12
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Publication No.: US11237202B2Publication Date: 2022-02-01
- Inventor: Duane Champoux , Srdjan Malisic
- Applicant: Advantest Corporation
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Main IPC: G01R31/317
- IPC: G01R31/317 ; G01R31/26 ; G01R31/319

Abstract:
Non-standard sector size system support for SSD testing. An automated test equipment for simultaneous testing of multiple solid state drives (SSDs), wherein the SSD has a sector size that is not an integral power of two, includes a tester block configured to receive a command to read and verify an amount of data from the SSD starting at a starting address. The starting address is not constrained to correspond to a sector boundary and the amount of data is not constrained to be an integral multiple of the SSD data sector size. The test equipment also includes logic within said tester block configured to determine a starting sector of the SSD that the starting address points to, and logic within said tester block configured to determine a number of sectors required for the amount of data to be read. The tester block is configured to read a sector from the SSD. The test equipment further includes a pattern generator configured to generate a pseudo-random sequence of data based on a sector number of the SSD, and logic configured to compare the data read from the SSD to the pseudo-random sequence of data.
Public/Granted literature
- US20200292609A1 NON-STANDARD SECTOR SIZE SYSTEM SUPPORT FOR SSD TESTING Public/Granted day:2020-09-17
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