Invention Grant
- Patent Title: Multiple inclined beam line-scanning imaging apparatus, methods, and applications
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Application No.: US16398630Application Date: 2019-04-30
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Publication No.: US11237370B2Publication Date: 2022-02-01
- Inventor: Kyu Young Han , Jialei Tang
- Applicant: University of Central Florida Research Foundation, Inc.
- Applicant Address: US FL Orlando
- Assignee: University of Central Florida Research Foundation, Inc.
- Current Assignee: University of Central Florida Research Foundation, Inc.
- Current Assignee Address: US FL Orlando
- Agency: Klintworth & Rozenblat IP LLP
- Agent William Greener
- Main IPC: G01N21/64
- IPC: G01N21/64 ; G02B21/00 ; G02B21/36 ; G02B21/02
Abstract:
A dual inclined beam line-scanning confocal microscope apparatus, associated method, and applications thereof. An embodied dual-inclined beam line-scanning confocal microscope (2iLS) utilizes dual, parallel excitation beams each having a focused line shape that are scanned over a fluorescent sample. The emitted fluorescence from the sample is spatially filtered and detected by an array detector. 2iLS microscopy provides high resolution, ultrasensitivity, and deep optical sectioning capability. A reduced excitation intensity lowers photobleaching and photodamage.
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