Invention Grant
- Patent Title: Obtaining data for fault identification
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Application No.: US17233801Application Date: 2021-04-19
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Publication No.: US11237892B1Publication Date: 2022-02-01
- Inventor: Naveena Kedlaya , Tushar Bajpai
- Applicant: Hewlett Packard Enterprise Development LP
- Applicant Address: US TX Houston
- Assignee: Hewlett Packard Enterprise Development LP
- Current Assignee: Hewlett Packard Enterprise Development LP
- Current Assignee Address: US TX Houston
- Agency: Hewlett Packard Enterprise Patent Department
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/07 ; G06F11/34 ; G06F11/30

Abstract:
Example techniques for obtaining data for identifying a fault are described. In response to receiving a fault message corresponding to a first device, a computing device determines a first set of data to be obtained for identifying the fault. The first set of data to be obtained is determined based on a workload of the computing device. The first set of data is then obtained.
Information query