Invention Grant
- Patent Title: Use of error correction-based metric for identifying poorly performing data storage devices
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Application No.: US16688992Application Date: 2019-11-19
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Publication No.: US11237893B2Publication Date: 2022-02-01
- Inventor: Robert Lester , Austin Striegel , Jared Tesone , Timothy Lieber , Evan Richardson , Donald Penza
- Applicant: Western Digital Technologies, Inc.
- Applicant Address: US CA San Jose
- Assignee: Western Digital Technologies, Inc.
- Current Assignee: Western Digital Technologies, Inc.
- Current Assignee Address: US CA San Jose
- Agent John D. Henkhaus
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/07 ; G06F11/10 ; G06F11/14 ; G06F3/06 ; G06F11/30 ; G06F11/20

Abstract:
An approach to identifying poorly performing data storage devices (DSDs) in a data storage system, such as hard disk drives (HDDs) and/or solid-state drives (SSDs), involves retrieving and evaluating a respective set of log pages, such as SCSI Log Sense counters, from each of multiple DSDs. Based on each respective set of log pages, a value for a Quality of Service (QoS) metric is determined for each respective DSD, where each QoS value represents an average percentage of bytes processed without the respective DSD performing an autonomous error correction. In response to a particular DSD reaching a predetermined threshold QoS value, an in-situ repair may be determined for the particular DSD or the particular DSD may be added to a list of candidate DSDs for further examination, which may include an FRPH examination for suitably configured DSDs.
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