Invention Grant
- Patent Title: Thin film transistor, display substrate, method for preparing the same, and display device
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Application No.: US16652219Application Date: 2019-10-18
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Publication No.: US11239264B2Publication Date: 2022-02-01
- Inventor: Tongshang Su , Dongfang Wang , Qinghe Wang , Liangchen Yan
- Applicant: HEFEI XINSHENG OPTOELECTRONICS TECHNOLOGY CO., LTD. , BOE TECHNOLOGY GROUP CO., LTD.
- Applicant Address: CN Anhui; CN Beijing
- Assignee: HEFEI XINSHENG OPTOELECTRONICS TECHNOLOGY CO., LTD.,BOE TECHNOLOGY GROUP CO., LTD.
- Current Assignee: HEFEI XINSHENG OPTOELECTRONICS TECHNOLOGY CO., LTD.,BOE TECHNOLOGY GROUP CO., LTD.
- Current Assignee Address: CN Anhui; CN Beijing
- Agency: Muncy, Geissler, Olds & Lowe, P.C.
- Priority: CN201811486004.X 20181206
- International Application: PCT/CN2019/111844 WO 20191018
- International Announcement: WO2020/114101 WO 20200611
- Main IPC: H01L21/00
- IPC: H01L21/00 ; H01L27/12

Abstract:
The present disclosure provides a thin film transistor, a display substrate, a method for preparing the same, and a display device including the display substrate. The method for preparing the thin film transistor includes: forming an inorganic insulating film layer in contact with an electrode of the thin film transistor by a plasma enhanced chemical vapor deposition process at power of 9 kW to 25 kW, at a temperature of 190° C. to 380° C. and by using a mixture of gases N2, NH3 and SiH4 in a volume ratio of N2:NH3:SiH4=(10˜20):(5˜10):(1˜2), such that a stress value of the inorganic insulating film layer is reduced to be less than or equal to a threshold, and the inorganic insulating layer comprises silicon nitride.
Public/Granted literature
- US20210134852A1 THIN FILM TRANSISTOR, DISPLAY SUBSTRATE, METHOD FOR PREPARING THE SAME, AND DISPLAY DEVICE Public/Granted day:2021-05-06
Information query
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