Invention Grant
- Patent Title: Gate driver with VGTH and VCESAT measurement capability for the state of health monitor
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Application No.: US17014828Application Date: 2020-09-08
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Publication No.: US11239839B2Publication Date: 2022-02-01
- Inventor: Xiong Li , Anant Kamath
- Applicant: Texas Instruments Incorporated
- Applicant Address: US TX Dallas
- Assignee: Texas Instruments Incorporated
- Current Assignee: Texas Instruments Incorporated
- Current Assignee Address: US TX Dallas
- Agent Valerie M. Davis; Charles A. Brill; Frank D. Cimino
- Main IPC: G01R31/26
- IPC: G01R31/26 ; H03K17/18 ; H03K17/567 ; G01R31/28 ; G01R31/42

Abstract:
In a power supply system, a high-side (HS) insulated-gate bipolar transistor (IGBT) has a first collector, a first gate, and a first emitter. A low-side (LS) IGBT has a second collector coupled to the first emitter, a second gate, and a second emitter. A gate drive circuit is coupled to the first gate of the HS IGBT and the second gate of the LS IGBT. A control circuit is coupled to the gate drive circuit. The control circuit is configured to control the gate drive circuit for biasing the HS IGBT to a HS saturation, and determine a HS degradation of the HS IGBT based on a HS digitized gate voltage of the HS IGBT in the HS saturation.
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