Invention Grant
- Patent Title: Method for spectroscopically or spectrometrically examining a sample, and interferometric device
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Application No.: US16634075Application Date: 2018-07-26
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Publication No.: US11243162B2Publication Date: 2022-02-08
- Inventor: Bernhard Lendl , Jakob Hayden , Bettina Baumgartner , Christian Kristament
- Applicant: TECHNISCHE UNIVERSITAET WIEN
- Applicant Address: AT Vienna
- Assignee: TECHNISCHE UNIVERSITAET WIEN
- Current Assignee: TECHNISCHE UNIVERSITAET WIEN
- Current Assignee Address: AT Vienna
- Agency: McCoy Russell LLP
- Priority: ATA50623/2017 20170726
- International Application: PCT/AT2018/060164 WO 20180726
- International Announcement: WO2019/018870 WO 20190131
- Main IPC: G01N21/3577
- IPC: G01N21/3577 ; G01N21/359 ; G01N21/39 ; G01N21/45 ; G01N21/17

Abstract:
A method and an interferometric device for spectroscopically or spectrometrically examining a sample, comprising: a) generating a laser beam having a wavelength, b) splitting the laser beam into a measurement beam and a reference beam, c) interacting the sample with the measurement beam, d) interacting a reference with the reference beam, e) overlaying the measurement beam and the reference beam, f) detecting a first output beam, g) detecting a second output beam, h) forming a differential signal between the first output signal and the second output signal, i) controlling the differential signal to a predefined target value, j) determining a refractive index of the sample from the adjustment of the phase difference between the measurement beam and the reference beam, k) repeating steps a) to j) for additional wavelengths of the laser beam.
Public/Granted literature
- US20200166453A1 METHOD FOR SPECTROSCOPICALLY OR SPECTROMETRICALLY EXAMINING A SAMPLE, AND INTERFEROMETRIC DEVICE Public/Granted day:2020-05-28
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