Invention Grant
- Patent Title: Phase-shift-based amplitude detector for a high-speed atomic force microscope
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Application No.: US17263485Application Date: 2019-07-23
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Publication No.: US11243229B2Publication Date: 2022-02-08
- Inventor: Atsushi Miyagi , Simon Scheuring
- Applicant: Cornell University
- Applicant Address: US NY Ithaca
- Assignee: Cornell University
- Current Assignee: Cornell University
- Current Assignee Address: US NY Ithaca
- Agency: McDermott Will & Emery LLP
- International Application: PCT/US2019/043049 WO 20190723
- International Announcement: WO2020/023516 WO 20200130
- Main IPC: G01Q60/34
- IPC: G01Q60/34 ; G01Q10/06

Abstract:
An atomic force microscope includes a cantilever operating in amplitude modulation mode. A controller determines the amplitude of the cantilever oscillation by processing a signal representative of the cantilever motion by square-rooting a signal having a value substantially equal to a sum of a square of the received signal and a squared and phase-shifted version of the received signal. The aforementioned processing, in some implementations is implemented using analog circuit components.
Public/Granted literature
- US20210172976A1 PHASE-SHIFT-BASED AMPLITUDE DETECTOR FOR A HIGH-SPEED ATOMIC FORCE MICROSCOPE Public/Granted day:2021-06-10
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