Invention Grant
- Patent Title: Log analysis apparatus, log analysis method, and log analysis program
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Application No.: US16568311Application Date: 2019-09-12
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Publication No.: US11243937B2Publication Date: 2022-02-08
- Inventor: Jana Backhus , Yosuke Himura , Mineyoshi Masuda
- Applicant: Hitachi, Ltd.
- Applicant Address: JP Tokyo
- Assignee: Hitachi, Ltd.
- Current Assignee: Hitachi, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Priority: JPJP2019-010359 20190124
- Main IPC: G06F7/00
- IPC: G06F7/00 ; G06F16/00 ; G06F16/23 ; G06F16/2455

Abstract:
A log labeling apparatus is configured to include a label importance DB and a similarity DB configured to store importance information between a plurality of labels and an action set and action set information identifying a first action set for calculating a second similarity with each label of a first log unit, a similarity calculation unit configured to calculate the second similarity with each label of the first log unit on the basis of the importance information, an action set of the first log unit, and the action set of the action set information, a post processor configured to detect label candidates, and an accumulation determination unit configured to determine a second action set for calculating a second similarity of a second log unit and to store action set information on the second action set in the similarity DB.
Public/Granted literature
- US20200242100A1 LOG ANALYSIS APPARATUS, LOG ANALYSIS METHOD, AND LOG ANALYSIS PROGRAM Public/Granted day:2020-07-30
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