Invention Grant
- Patent Title: Data analysis device and analysis method
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Application No.: US15557542Application Date: 2015-09-16
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Publication No.: US11244235B2Publication Date: 2022-02-08
- Inventor: Kazuaki Tokunaga , Syunsuke Monai
- Applicant: Hitachi, Ltd.
- Applicant Address: JP Tokyo
- Assignee: Hitachi, Ltd.
- Current Assignee: Hitachi, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- International Application: PCT/JP2015/076363 WO 20150916
- International Announcement: WO2017/046906 WO 20170323
- Main IPC: G06N5/04
- IPC: G06N5/04 ; G06F16/00 ; G06F16/245 ; G06N5/02

Abstract:
A data analysis device that analyzes data having a record including an objective variable and a plurality of explanatory variables includes a node generating unit that generates a node specified by a condition of the explanatory variable on the basis of the objective variable and the explanatory variable of the record and associating the record with the node, an evaluation value generating unit that generates a proportion of the number of records whose target value is the objective variable among a plurality of records associated with the node as an evaluation value, and a parameter extracting unit that selects a node on the basis of the evaluation value and extracts and outputs the condition of the explanatory variable related to the selected node.
Public/Granted literature
- US20180046927A1 DATA ANALYSIS DEVICE AND ANALYSIS METHOD Public/Granted day:2018-02-15
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