Invention Grant
- Patent Title: Lens examination equipment and method
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Application No.: US16342715Application Date: 2017-10-17
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Publication No.: US11248988B2Publication Date: 2022-02-15
- Inventor: Thomas Drew , Michal Krawczynski , Omkar Joshi , Joseph Davies , Suraj Sudera , Jonathan Dean
- Applicant: EYOTO GROUP LIMITED
- Applicant Address: GB Birmingham
- Assignee: EYOTO GROUP LIMITED
- Current Assignee: EYOTO GROUP LIMITED
- Current Assignee Address: GB Birmingham
- Agency: Dickinson Wright PLLC
- Priority: GB1617652 20161018,GB1619772 20161123
- International Application: PCT/GB2017/053136 WO 20171017
- International Announcement: WO2018/073577 WO 20180426
- Main IPC: G01M11/02
- IPC: G01M11/02

Abstract:
A test pattern (170) comprising a set of dots (174) which define a first ellipse (176) of best fit in which the major and minor axes R1, R2 are equal (i.e. a circle) is displayed on a plane surface and a digital image of the (usually distorted) test pattern seen through a lens is captured. A second ellipse of best fit joining the dots in the set is derived from the distorted test pattern in the image. Characteristics of the first and second ellipses are compared to determine the degree and nature of distortion to the test pattern, from which the power of the lens is calculated. The major and minor axes of the first and second ellipses may be compared. The test pattern can include a number of said sets of dots distributed over an area of the surface with each set being analysed to determine the optical parameters of the lens at multiple locations.
Public/Granted literature
- US20200041378A1 LENS EXAMINATION EQUIPMENT AND METHOD Public/Granted day:2020-02-06
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