• Patent Title: Device and method for detecting faults of a structure
  • Application No.: US16755362
    Application Date: 2018-10-11
  • Publication No.: US11249050B2
    Publication Date: 2022-02-15
  • Inventor: Luca PalladinoSabri Janfaoui
  • Applicant: SAFRAN
  • Applicant Address: FR Paris
  • Assignee: SAFRAN
  • Current Assignee: SAFRAN
  • Current Assignee Address: FR Paris
  • Agency: Sughrue Mion, PLLC
  • Priority: FR1759562 20171012,FR1851433 20180220
  • International Application: PCT/FR2018/052530 WO 20181011
  • International Announcement: WO2019/073179 WO 20190418
  • Main IPC: G01N29/04
  • IPC: G01N29/04 G01N29/24
Device and method for detecting faults of a structure
Abstract:
The invention relates to a device for detecting faults of a structure (STR), the device comprising a calculation unit and a plurality of transducers (100) intended to be positioned on or in the structure (STR), first transducers (E) of the plurality de transducers (100) being capable of being in an emission mode, second transducers (R) of the plurality of transducers (100) being capable of being in a reception mode, characterized in that the first transducers (E) form a hexagonal meshing so as to delimit between them several mutually adjacent mesh cells, the second transducers (R) being positioned on respective emission circles of the first transducers (E), each emission circle of a first transducer (E) being centered on the first transducer (E).
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