Invention Grant
- Patent Title: Specimen analyzer and specimen analysis method for controlling an output of a target component in an abnormal range to prevent erroneous diagnosis
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Application No.: US15609270Application Date: 2017-05-31
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Publication No.: US11249096B2Publication Date: 2022-02-15
- Inventor: Seiji Takemoto , Takeshi Komoto , Hideki Hirayama , Takashi Yoshida , James Ausdenmoore
- Applicant: Sysmex Corporation
- Applicant Address: JP Kobe
- Assignee: Sysmex Corporation
- Current Assignee: Sysmex Corporation
- Current Assignee Address: JP Kobe
- Agency: Metrolex IP Law Group, PLLC
- Main IPC: G01N35/00
- IPC: G01N35/00
Abstract:
A specimen analyzer includes: an analysis unit which analyzes a specimen collected from a subject and generates an analysis result including a component amount in the specimen; an output unit which outputs the analysis result; and a controller which causes the output unit to output or not to output the component amount based on a comparison between the component amount and a determination reference value.
Public/Granted literature
- US20180348241A1 SPECIMEN ANALYZER AND SPECIMEN ANALYSIS METHOD Public/Granted day:2018-12-06
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