Invention Grant
- Patent Title: IGBT-module condition monitoring equipment and method
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Application No.: US16850770Application Date: 2020-04-16
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Publication No.: US11249129B2Publication Date: 2022-02-15
- Inventor: Pinjia Zhang , Yanyong Yang , Zheng Wang , Hongdong Zhu
- Applicant: Tsinghua University , Envision Energy (Jiangsu) Co., Ltd.
- Applicant Address: CN Beijing; CN Jiangyin
- Assignee: Tsinghua University,Envision Energy (Jiangsu) Co., Ltd.
- Current Assignee: Tsinghua University,Envision Energy (Jiangsu) Co., Ltd.
- Current Assignee Address: CN Beijing; CN Jiangyin
- Agency: Dragon Sun Law Firm, PC
- Agent Jinggao Li, Esq.
- Priority: CN201910825141.X 20190903
- Main IPC: G01R31/26
- IPC: G01R31/26 ; H01L21/66 ; H01L29/739

Abstract:
Disclosed are an IGBT-module condition monitoring equipment and method. The IGBT-module condition monitoring equipment includes an IGBT module, a gate turning-on voltage overshoot monitoring module, a driving circuit, a bond wire state judging module, and a signal acquisition module. The breakage condition of bond wires is obtained by comparing a monitored actual gate turning-on voltage overshoot with a preset reference gate turning-on voltage overshoot threshold. The present invention solves the problem encountered in monitoring the aging of IGBT bond wires in power electronic converters. By characterizing the bond wire detachment with the gate turning-on voltage overshoot, the slight aging of the detached bond wires can be monitored without disturbing the operation, which is high in resolution and free of invasiveness and enables real-time online monitoring at high sampling rate and low cost, showing great significance in the monitoring of the IGBT and the reliability evaluation of power electronic converters.
Public/Granted literature
- US20210063466A1 IGBT-MODULE CONDITION MONITORING EQUIPMENT AND METHOD Public/Granted day:2021-03-04
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