Invention Grant
- Patent Title: Radiation image detector and manufacture method thereof
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Application No.: US17017374Application Date: 2020-09-10
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Publication No.: US11249204B2Publication Date: 2022-02-15
- Inventor: Zhongshou Huang , Tieer Gu
- Applicant: IRAY TECHNOLOGY COMPANY LIMITED
- Applicant Address: CN Shanghai
- Assignee: IRAY TECHNOLOGY COMPANY LIMITED
- Current Assignee: IRAY TECHNOLOGY COMPANY LIMITED
- Current Assignee Address: CN Shanghai
- Agency: W&G Law Group
- Priority: CN202010072660.6 20200121
- Main IPC: G01T1/24
- IPC: G01T1/24 ; G01T1/20 ; A61B6/00

Abstract:
Embodiments of the present invention provide a radiation image detector and a manufacture method to produce the radiation image detector. The radiation image detector includes: a radiation conversion layer, configured to convert a radiation image into a visible light image; an image sensing layer for visible light, including a pixel array formed by a plurality of photosensitive pixels, configured to detect the visible light image; and a microlens layer, disposed between the radiation conversion layer and the image sensing layer, the microlens layer including a lens array formed by multiple micro convex lenses, and optical axes of the micro convex lenses being perpendicular to the image sensing layer. In addition, both the radiation conversion layer and the microlens layer have curved surface structures that are bended in the same direction that non-parallel radiations, emitted from an X-ray generator, will impinge perpendicularly on the radiation conversion layer.
Public/Granted literature
- US20210223417A1 RADIATION IMAGE DETECTOR AND MANUFACTURE METHOD THEREOF Public/Granted day:2021-07-22
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