Invention Grant
- Patent Title: Best solution calculation method and dominant solution calculation method for calculation parameter in powder diffraction pattern, and program thereof
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Application No.: US16618784Application Date: 2018-06-01
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Publication No.: US11255802B2Publication Date: 2022-02-22
- Inventor: Masami Tsubota
- Applicant: PHYSONIT INC.
- Applicant Address: JP Kaita-cho
- Assignee: PHYSONIT INC.
- Current Assignee: PHYSONIT INC.
- Current Assignee Address: JP Kaita-cho
- Priority: JPJP2017-110500 20170602
- International Application: PCT/JP2018/021153 WO 20180601
- International Announcement: WO2018/221718 WO 20181206
- Main IPC: G01N23/2005
- IPC: G01N23/2005 ; G01N23/207

Abstract:
The present invention provides a method to calculate refinement parameters from an observed diffraction pattern for powder samples accurately. A method to calculate a best solution of the crystal structural parameters from a diffraction pattern, comprising: a third calculating step of the converged values 600 to calculate at least three converged values; a third judging step of the best converged values 700 to calculate at least three criteria from the peak-shift parameters in the converged values and to judge whether the converged values are a true solution of not by using the criteria; and a first calculating step of a global solution 800 to calculate a global solution of which is the true value by using the criteria.
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