Invention Grant
- Patent Title: Measuring a noise level of an accelerometer
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Application No.: US16824161Application Date: 2020-03-19
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Publication No.: US11255876B2Publication Date: 2022-02-22
- Inventor: Sriraman Dakshinamurthy , Matthew Julian Thompson , Vadim Tsinker
- Applicant: INVENSENSE, INC.
- Applicant Address: US CA San Jose
- Assignee: INVENSENSE, INC.
- Current Assignee: INVENSENSE, INC.
- Current Assignee Address: US CA San Jose
- Agency: Amin, Turocy & Watson, LLP
- Main IPC: G01P21/00
- IPC: G01P21/00 ; G01P15/125 ; G01P15/08

Abstract:
A method of measuring noise of an accelerometer can comprise exposing the accelerometer comprising a micro-electro-mechanical system (MEMS) component coupled to an application specific integrated circuit component (ASIC), to an external environmental input, with the MEMS component being configured to provide a first output to the ASIC based on the external environmental input. The method can further comprise estimating a first noise generated by operation of the MEMS component, and replacing the first output provided to the ASIC from the MEMS component, with a second output generated by a MEMS emulator component, with the second output comprising the first noise. Further, the method can include generating an output of the accelerometer based on the second output processed by the ASIC.
Public/Granted literature
- US20200300887A1 MEASURING A NOISE LEVEL OF AN ACCELEROMETER Public/Granted day:2020-09-24
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