A method for measuring modulated radio frequency (RF) signals from a device under test (DUT) includes inputting a test RF signal to the DUT, where the test RF signal is modulated with a repetitive complex waveform and a pulsed waveform, the repetitive complex waveform including multiple RF tones with an RF tone spacing and an RF repetition period, where a pulse width of the pulsed waveform is less than the RF repetition period; acquiring an output RF signal from the DUT responsive to the input test RF signal; down converting the output RF signal to an intermediate frequency (IF) signal; sampling the IF signal using an analog to digital converter (ADC) having an ADC clock frequency; measuring ADC samples of the IF signal; and reconstructing the test RF signal modulated with the repetitive complex waveform using the measured ADC samples.