Invention Grant
- Patent Title: Interconnect structure and method for manufacturing the interconnect structure
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Application No.: US16884925Application Date: 2020-05-27
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Publication No.: US11257753B2Publication Date: 2022-02-22
- Inventor: Khaderbad Mrunal Abhijith , Yu-Yun Peng , Fu-Ting Yen , Chen-Han Wang , Tsu-Hsiu Perng , Keng-Chu Lin
- Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- Current Assignee Address: TW Hsinchu
- Agency: WPAT, P.C., Intellectual Property Attorneys
- Agent Anthony King
- Main IPC: H01L23/522
- IPC: H01L23/522 ; H01L23/532 ; H01L21/768

Abstract:
The present disclosure provides an interconnect structure, including a substrate having a conductive region adjacent to a gate region, a contact over the conductive region, a first interlayer dielectric layer (ILD) surrounding the contact, a via over the contact, a first densified dielectric layer surrounding the via, wherein the densified dielectric layer has a first density, and a second ILD layer over the first ILD layer and surrounding the via, wherein the second ILD layer has a second density, the first density is greater than a second density.
Public/Granted literature
- US20210225762A1 INTERCONNECT STRUCTURE AND METHOD FOR MANUFACTURING THE INTERCONNECT STRUCTURE Public/Granted day:2021-07-22
Information query
IPC分类: