Invention Grant
- Patent Title: Method of depositing silicon oxide films
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Application No.: US16822390Application Date: 2020-03-18
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Publication No.: US11261523B2Publication Date: 2022-03-01
- Inventor: Tae Ho Yoon , Hyung Sang Park , Yong Min Yoo
- Applicant: ASM Korea Ltd.
- Applicant Address: KR Gyeonggi-do
- Assignee: ASM Korea Ltd.
- Current Assignee: ASM Korea Ltd.
- Current Assignee Address: KR Gyeonggi-do
- Agency: Knobbe, Martens, Olson & Bear LLP
- Priority: KR10-2007-0080581 20070810
- Main IPC: C23C16/40
- IPC: C23C16/40 ; C23C16/455 ; H01L21/762 ; H01L23/535 ; H01L23/64 ; C04B35/14 ; C01B33/113

Abstract:
Methods of depositing a silicon oxide film are disclosed. One embodiment is a plasma enhanced atomic layer deposition (PEALD) process that includes supplying a vapor phase silicon precursor, such as a diaminosilane compound, to a substrate, and supplying oxygen plasma to the substrate. Another embodiment is a pulsed hybrid method between atomic layer deposition (ALD) and chemical vapor deposition (CVD). In the other embodiment, a vapor phase silicon precursor, such as a diaminosilane compound, is supplied to a substrate while ozone gas is continuously or discontinuously supplied to the substrate.
Information query
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