Invention Grant
- Patent Title: Surface texture measuring device, surface texture measuring system, and program
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Application No.: US16013275Application Date: 2018-06-20
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Publication No.: US11262179B2Publication Date: 2022-03-01
- Inventor: Shinsaku Abe
- Applicant: MITUTOYO CORPORATION
- Applicant Address: JP Kanagawa
- Assignee: MITUTOYO CORPORATION
- Current Assignee: MITUTOYO CORPORATION
- Current Assignee Address: JP Kanagawa
- Agency: Greenblum & Bernstein, P.L.C.
- Priority: JPJP2017-123735 20170623
- Main IPC: G01B5/28
- IPC: G01B5/28 ; G01B5/008 ; G01B17/08 ; G01B21/04

Abstract:
A surface texture measuring device according to the present invention includes a surface texture detecting component that outputs measurement results for a surface texture of a measurable object, where the measurement results are recognized as a change in the movement of a contact pin of a detector when tracing a surface of the measurable object with the contact pin; a posture detecting sensor that detects a measured posture, which is a posture at the time of measurement by the detector; a memory component that is preloaded with correction values corresponding to each of a plurality of postures; and a correcting component that compares the measured posture with the plurality of postures stored in the memory component, and corrects the measurement results using a correction value that corresponds to a posture equivalent to the measured posture.
Public/Granted literature
- US20180372473A1 SURFACE TEXTURE MEASURING DEVICE, SURFACE TEXTURE MEASURING SYSTEM, AND PROGRAM Public/Granted day:2018-12-27
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