- Patent Title: Three-dimensional measurement device, sensor device for three-dimensional measurement, and method for performing control in three-dimensional measurement device
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Application No.: US17052520Application Date: 2019-05-30
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Publication No.: US11262193B2Publication Date: 2022-03-01
- Inventor: Motoharu Okuno , Hitoshi Nakatsuka
- Applicant: OMRON Corporation
- Applicant Address: JP Kyoto
- Assignee: OMRON Corporation
- Current Assignee: OMRON Corporation
- Current Assignee Address: JP Kyoto
- Agency: JCIPRNET
- Priority: JPJP2018-112506 20180613
- International Application: PCT/JP2019/021496 WO 20190530
- International Announcement: WO2019/239905 WO 20191219
- Main IPC: G01B11/25
- IPC: G01B11/25 ; G02B7/04

Abstract:
This three-dimensional measurement device includes: a light source, a lens guiding light from the light source to a subject, a photomask disposed on the optical axis between the light source and lens and having a predetermined pattern, a driving device changing the position of one member from the lens and photomask or changing an optical characteristic of the lens, and a control unit controlling the driving device. The control unit fixes an image formation position for light/dark pattern light formed by the photomask at the position of the subject by fixing the position of said member or the optical characteristic of the lens when specifying a first mode, and varies the position of the member or the optical characteristic of the lens to vary the image formation position for the light/dark pattern light such that the light/dark difference caused by the light/dark pattern light is smaller than in the first mode when specifying a second mode.
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