• Patent Title: Three-dimensional measurement device, sensor device for three-dimensional measurement, and method for performing control in three-dimensional measurement device
  • Application No.: US17052520
    Application Date: 2019-05-30
  • Publication No.: US11262193B2
    Publication Date: 2022-03-01
  • Inventor: Motoharu OkunoHitoshi Nakatsuka
  • Applicant: OMRON Corporation
  • Applicant Address: JP Kyoto
  • Assignee: OMRON Corporation
  • Current Assignee: OMRON Corporation
  • Current Assignee Address: JP Kyoto
  • Agency: JCIPRNET
  • Priority: JPJP2018-112506 20180613
  • International Application: PCT/JP2019/021496 WO 20190530
  • International Announcement: WO2019/239905 WO 20191219
  • Main IPC: G01B11/25
  • IPC: G01B11/25 G02B7/04
Three-dimensional measurement device, sensor device for three-dimensional measurement, and method for performing control in three-dimensional measurement device
Abstract:
This three-dimensional measurement device includes: a light source, a lens guiding light from the light source to a subject, a photomask disposed on the optical axis between the light source and lens and having a predetermined pattern, a driving device changing the position of one member from the lens and photomask or changing an optical characteristic of the lens, and a control unit controlling the driving device. The control unit fixes an image formation position for light/dark pattern light formed by the photomask at the position of the subject by fixing the position of said member or the optical characteristic of the lens when specifying a first mode, and varies the position of the member or the optical characteristic of the lens to vary the image formation position for the light/dark pattern light such that the light/dark difference caused by the light/dark pattern light is smaller than in the first mode when specifying a second mode.
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