Invention Grant
- Patent Title: Instrument calibration device and calibration method using same
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Application No.: US16476473Application Date: 2017-08-22
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Publication No.: US11262229B2Publication Date: 2022-03-01
- Inventor: Shichun Zhao , Lijun Dong , Baoqi Liu
- Applicant: Beijing Const Instruments Technology Inc.
- Applicant Address: CN Beijing
- Assignee: Beijing Const Instruments Technology Inc.
- Current Assignee: Beijing Const Instruments Technology Inc.
- Current Assignee Address: CN Beijing
- Agency: Lerner, David, Littenberg, Krumholz & Mentlik, LLP
- Priority: CN201710017182.7 20170110,CN201720028892.5 20170110
- International Application: PCT/CN2017/098458 WO 20170822
- International Announcement: WO2018/129925 WO 20180719
- Main IPC: G01F25/00
- IPC: G01F25/00 ; G01F1/36 ; G01N21/45 ; G01N33/00 ; F16K37/00
Abstract:
An instrument calibration apparatus and a calibration method using same. The apparatus comprises a physical quantity input/output unit, a physical quantity measurement unit, a physical quantity configuration unit, a display unit, a man-machine interaction unit, a storage unit, and a control unit. The apparatus can be widely applied to automatic calibration of multivariable instruments.
Public/Granted literature
- US20200319012A1 Instrument Calibration Device And Calibration Method Using Same Public/Granted day:2020-10-08
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