- Patent Title: Observation apparatus, observation method and observation program
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Application No.: US16148261Application Date: 2018-10-01
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Publication No.: US11262275B2Publication Date: 2022-03-01
- Inventor: Wei Luo , Tadashi Okita , Junichi Tezuka
- Applicant: FANUC CORPORATION
- Applicant Address: JP Yamanashi
- Assignee: FANUC CORPORATION
- Current Assignee: FANUC CORPORATION
- Current Assignee Address: JP Yamanashi
- Agency: Wenderoth, Lind & Ponack, L.L.P.
- Priority: JPJP2017-205240 20171024
- Main IPC: G01M99/00
- IPC: G01M99/00

Abstract:
To provide an observation apparatus, an observation method and an observation program capable of easily understandable output of a relation between a signal waveform representing an actually-observed operation of a machine and an instruction program to the machine. An observation apparatus includes an observation data acquisition unit for acquiring observation data on an operation status of a machine along with time information, an execution status acquisition unit for acquiring execution status data including an execution position and a specific parameter value for an instruction program to the machine, along with time information, and a display unit for displaying the observation data and the execution status data in association with each other in time series.
Public/Granted literature
- US20190120726A1 OBSERVATION APPARATUS, OBSERVATION METHOD AND OBSERVATION PROGRAM Public/Granted day:2019-04-25
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