Invention Grant
- Patent Title: Measuring X-ray CT apparatus and production work piece measurement method
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Application No.: US16291699Application Date: 2019-03-04
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Publication No.: US11262319B2Publication Date: 2022-03-01
- Inventor: Hidemitsu Asano , Masato Kon
- Applicant: MITUTOYO CORPORATION
- Applicant Address: JP Kanagawa
- Assignee: MITUTOYO CORPORATION
- Current Assignee: MITUTOYO CORPORATION
- Current Assignee Address: JP Kanagawa
- Agency: Greenblum & Bernstein, P.L.C.
- Priority: JPJP2018-044787 20180312
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G01N23/083 ; G01N23/046 ; G06T15/08 ; G06T7/00

Abstract:
When measuring a mass-produced work piece using a measuring X-ray CT apparatus, which is configured to emit X-rays while rotating a work piece that is arranged on a rotary table and to reconstruct a projection image thereof to generate volume data of the work piece, the present invention assigns values to volume data for a predetermined work piece and stores the same as master data; obtains volume data for a mass-produced work piece under identical conditions to the predetermined work piece; measures the volume data and obtains an X-ray CT measured value for the mass-produced work piece; and corrects the X-ray CT measured value for the mass-produced work piece using the master data.
Public/Granted literature
- US20190277780A1 MEASURING X-RAY CT APPARATUS AND PRODUCTION WORK PIECE MEASUREMENT METHOD Public/Granted day:2019-09-12
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