Invention Grant
- Patent Title: Specimen analysis substrate, specimen analysis device, specimen analysis system, and program for specimen analysis system
-
Application No.: US16066641Application Date: 2016-12-22
-
Publication No.: US11262356B2Publication Date: 2022-03-01
- Inventor: Fusatoshi Okamoto , Masahiro Johno
- Applicant: PHC HOLDINGS CORPORATION
- Applicant Address: JP Tokyo
- Assignee: PHC HOLDINGS CORPORATION
- Current Assignee: PHC HOLDINGS CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: McDermott Will and Emery LLP
- Priority: JPJP2015-256412 20151228
- International Application: PCT/JP2016/088569 WO 20161222
- International Announcement: WO2017/115733 WO 20170706
- Main IPC: G01N33/543
- IPC: G01N33/543 ; G01N37/00 ; G01N35/00 ; G01N35/10 ; B01L3/00

Abstract:
A sample analysis substrate includes a substrate; a first holding chamber; a reaction chamber; a first flow path having a first opening and a second opening respectively connected with the first holding chamber and reaction chamber; a main chamber; a second flow path having a third opening and a fourth opening respectively connected with the reaction chamber and the main chamber; and a magnet accommodation chamber capable of accommodating a magnet. The first opening is located closer to a rotation shaft than the second opening. The second opening is located closer to the rotation shaft than the third opening. The magnet accommodation chamber is located at a position at which, in the case where the magnet is accommodated in the magnet accommodation chamber, the magnet captures magnetic particles in the main chamber. The sample analysis substrate is rotatable to transfer a liquid.
Public/Granted literature
Information query
IPC分类: