Invention Grant
- Patent Title: Automatic analyzer and automatic analysis method
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Application No.: US16465764Application Date: 2017-11-07
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Publication No.: US11262371B2Publication Date: 2022-03-01
- Inventor: Masashi Fukaya , Shinji Azuma , Takuya Takahashi , Takumi Ito
- Applicant: Hitachi High-Technologies Corporation
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Crowell & Moring LLP
- Priority: JPJP2016-240487 20161212
- International Application: PCT/JP2017/040023 WO 20171107
- International Announcement: WO2018/110145 WO 20180621
- Main IPC: G01N35/02
- IPC: G01N35/02 ; G01N35/10 ; G01N1/28 ; G01N35/04

Abstract:
An automatic analyzer controls a sequence including optical measurement and cleaning and includes a discharge mechanism including a discharge nozzle for discharging a liquid into a reaction vessel; and an overflow suction mechanism including an overflow suction nozzle for sucking an overflow amount of the liquid in the reaction vessel. In a liquid discharge step included in a cleaning process and interposed between a preceding step using a detergent and a succeeding blank value measurement step, the automatic analyzer establishes a first state where a lower end of the discharge nozzle is located in a height-wise lower part of the reaction vessel and a lower end of the overflow suction nozzle is located in an upper part of the reaction vessel, and provides control to carry out the discharge of liquid from the discharge nozzle and the suction of the overflow amount of liquid through the overflow suction nozzle.
Public/Granted literature
- US20200072856A1 Automatic Analyzer and Automatic Analysis Method Public/Granted day:2020-03-05
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