Invention Grant
- Patent Title: Testing fixture and testing assembly
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Application No.: US16670134Application Date: 2019-10-31
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Publication No.: US11262398B2Publication Date: 2022-03-01
- Inventor: Ching-Chung Wang , Jui-Hsiu Jao
- Applicant: NANYA TECHNOLOGY CORPORATION
- Applicant Address: TW New Taipei
- Assignee: NANYA TECHNOLOGY CORPORATION
- Current Assignee: NANYA TECHNOLOGY CORPORATION
- Current Assignee Address: TW New Taipei
- Agency: Muncy, Geissler, Olds & Lowe, P.C.
- Main IPC: G01R1/04
- IPC: G01R1/04 ; G01R1/067 ; G01R1/073 ; G01R31/26 ; G01R31/28

Abstract:
The present disclosure provides a testing fixture. The testing fixture includes a carrier, a plurality of sets of electrical lines and a plurality of electrical lines. The carrier includes a base and a frame extending along an upper surface of the base. The base and the frame define a first recess, a second recess extending longitudinally from the first recess, and a third recess extending transversely from the first recess. The plurality of sets of electrical contacts are disposed on the base and arranged in a rotationally symmetrical manner, and the electrical lines are electrically connected to the plurality of sets of electrical contacts.
Public/Granted literature
- US20210132138A1 TESTING FIXTURE AND TESTING ASSEMBLY Public/Granted day:2021-05-06
Information query