Invention Grant
- Patent Title: Method, apparatus and device for detecting abnormity of energy metering chip, and medium
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Application No.: US17010879Application Date: 2020-09-03
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Publication No.: US11262429B2Publication Date: 2022-03-01
- Inventor: Zhengxun Wu , Ching-Kae Tzou
- Applicant: Hangzhou Vango Technologies, Inc.
- Applicant Address: CN Zhejiang
- Assignee: Hangzhou Vango Technologies, Inc.
- Current Assignee: Hangzhou Vango Technologies, Inc.
- Current Assignee Address: CN Zhejiang
- Agency: Apex Attorneys at Law, LLP
- Agent Yue (Robert) Xu
- Priority: CN202010537388.4 20200612
- Main IPC: G01R35/04
- IPC: G01R35/04 ; G01R21/06

Abstract:
Provided are a method, an apparatus and a device for detecting abnormity of an energy metering chip. The method includes: inputting a target self-test signal to a to-be-tested component of a target energy metering chip in response to the target energy metering chip beginning to run under driving of a power signal; acquiring a first output signal from an output terminal of the to-be-tested component, and inputting the first output signal to a notch filter; inputting a second output signal from an output terminal of the notch filter to a signal correlator, and acquiring a third output signal from an output terminal of the signal correlator; and detecting a running state of the to-be-tested component based on the third output signal, to determine whether the target energy metering chip is abnormal.
Public/Granted literature
- US20210389405A1 METHOD, APPARATUS AND DEVICE FOR DETECTING ABNORMITY OF ENERGY METERING CHIP, AND MEDIUM Public/Granted day:2021-12-16
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