The invention relates to a method for the dynamic parameterization of at least one sensor in an industrial process in which measurement data of the process are acquired by means of a configuration sensor and of a productive sensor, with the configuration sensor and the productive sensor being sensors of the same kind; the measurement data are transmitted to a control unit; the control unit generates a parameter set for the productive sensor with reference to the measurement data and transmits the parameter set to the productive sensor; and the productive sensor uses the parameter set in operation.