Invention Grant
- Patent Title: Device for testing blockchain network
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Application No.: US16847822Application Date: 2020-04-14
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Publication No.: US11263108B2Publication Date: 2022-03-01
- Inventor: Shenbin Zhang , Bingfeng Pi , Jun Sun
- Applicant: FUJITSU LIMITED
- Applicant Address: JP Kawasaki
- Assignee: FUJITSU LIMITED
- Current Assignee: FUJITSU LIMITED
- Current Assignee Address: JP Kawasaki
- Agency: Staas & Halsey LLP
- Priority: CN201910298897.3 20190415
- Main IPC: G06F11/34
- IPC: G06F11/34 ; H04L9/06

Abstract:
A device for testing a blockchain network is provided. The device includes a processor. The processor is configured to calculate a matching degree between a configuration of the blockchain network and a template configuration corresponding to application scenario of the blockchain network; calculate performance of the blockchain network; calculate a health degree for the blockchain network; and determine whether the blockchain network is in a stable state based on the matching degree, the performance and the health degree.
Public/Granted literature
- US20200327030A1 DEVICE FOR TESTING BLOCKCHAIN NETWORK Public/Granted day:2020-10-15
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