Invention Grant
- Patent Title: Constraint determination system and method for semiconductor circuit
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Application No.: US16917600Application Date: 2020-06-30
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Publication No.: US11263375B2Publication Date: 2022-03-01
- Inventor: Yi-Lin Chuang , Shi-Wen Tan , Szu-Ju Huang , Shih-Feng Hong
- Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. , TSMC NANJING COMPANY LIMITED
- Applicant Address: TW Hsinchu; CN Nanjing
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.,TSMC NANJING COMPANY LIMITED
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.,TSMC NANJING COMPANY LIMITED
- Current Assignee Address: TW Hsinchu; CN Nanjing
- Agency: Maschoff Brennan
- Priority: CN202010435223.6 20200521
- Main IPC: G06F30/31
- IPC: G06F30/31 ; G06F111/04 ; G06F111/06

Abstract:
A method, for determining constraints related to a target circuit, includes following operations. First circuit speed results of the target circuit under different candidate constraint configurations are accumulated. Breakthrough probability distributions relative to each of the candidate constraint configurations are determined according to the first circuit speed results. First selected constraint configurations are determined from the candidate constraint configurations by sampling the breakthrough probability distributions. A first budget distribution is determined among the first selected constraint configurations. In response to that the first budget distribution is converged, the first selected constraint configurations in the first budget distribution is utilized for implementing the target circuit and generating an updated circuit speed result of the target circuit.
Public/Granted literature
- US20210365620A1 CONSTRAINT DETERMINATION SYSTEM AND METHOD FOR SEMICONDUCTOR CIRCUIT Public/Granted day:2021-11-25
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